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Predicting post-release defects using pre-release field testing results

Foutse Khomh, B. Chan, Ying Zou, A. Sinha and D. Dietz

Paper (2011)

Document published while its authors were not affiliated with Polytechnique Montréal

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PolyPublie URL: https://publications.polymtl.ca/16671/
Conference Title: IEEE International Conference on Software Maintenance (ICSM 2011)
Conference Location: Williamsburg, VA, USA
Conference Date(s): 2011-09-25 - 2011-10-01
Publisher: IEEE
DOI: 10.1109/icsm.2011.6080792
Official URL: https://doi.org/10.1109/icsm.2011.6080792
Date Deposited: 18 Apr 2023 15:12
Last Modified: 25 Sep 2024 15:54
Cite in APA 7: Khomh, F., Chan, B., Zou, Y., Sinha, A., & Dietz, D. (2011, September). Predicting post-release defects using pre-release field testing results [Paper]. IEEE International Conference on Software Maintenance (ICSM 2011), Williamsburg, VA, USA. https://doi.org/10.1109/icsm.2011.6080792

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