Foutse Khomh, B. Chan, Ying Zou, A. Sinha and D. Dietz
Paper (2011)
Document published while its authors were not affiliated with Polytechnique Montréal
An external link is available for this itemPolyPublie URL: | https://publications.polymtl.ca/16671/ |
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Conference Title: | IEEE International Conference on Software Maintenance (ICSM 2011) |
Conference Location: | Williamsburg, VA, USA |
Conference Date(s): | 2011-09-25 - 2011-10-01 |
Publisher: | IEEE |
DOI: | 10.1109/icsm.2011.6080792 |
Official URL: | https://doi.org/10.1109/icsm.2011.6080792 |
Date Deposited: | 18 Apr 2023 15:12 |
Last Modified: | 25 Sep 2024 15:54 |
Cite in APA 7: | Khomh, F., Chan, B., Zou, Y., Sinha, A., & Dietz, D. (2011, September). Predicting post-release defects using pre-release field testing results [Paper]. IEEE International Conference on Software Maintenance (ICSM 2011), Williamsburg, VA, USA. https://doi.org/10.1109/icsm.2011.6080792 |
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