An accurate estimation of the Levenshtein distance using metric trees and Manhattan distance

Thierry Lavoie and Ettore Merlo

Paper (2012)

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Department:	Department of Computer Engineering and Software Engineering
PolyPublie URL:	https://publications.polymtl.ca/15115/
Conference Title:	6th International Workshop on Software Clones (IWSC 2012)
Conference Location:	Zurich, Switzerland
Conference Date(s):	2012-06-04
Publisher:	Institute of Electrical and Electronics Engineers
DOI:	10.1109/iwsc.2012.6227861
Official URL:	https://doi.org/10.1109/iwsc.2012.6227861
Date Deposited:	18 Apr 2023 15:11
Last Modified:	08 Apr 2025 12:19

Cite in APA 7:	Lavoie, T., & Merlo, E. (2012, June). An accurate estimation of the Levenshtein distance using metric trees and Manhattan distance [Paper]. 6th International Workshop on Software Clones (IWSC 2012), Zurich, Switzerland. https://doi.org/10.1109/iwsc.2012.6227861
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