Mark D. Syer, Meiyappan Nagappan, Bram Adams and Ahmed E. Hassan
Article (2015)
An external link is available for this item
| Department: | Department of Computer Engineering and Software Engineering |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/10905/ |
| Journal Title: | IEEE Transactions on Software Engineering (vol. 41, no. 2) |
| Publisher: | IEEE |
| DOI: | 10.1109/tse.2014.2361131 |
| Official URL: | https://doi.org/10.1109/tse.2014.2361131 |
| Date Deposited: | 18 Apr 2023 15:07 |
| Last Modified: | 25 Sep 2024 15:47 |
| Cite in APA 7: | Syer, M. D., Nagappan, M., Adams, B., & Hassan, A. E. (2015). Replicating and re-evaluating the theory of relative defect-proneness. IEEE Transactions on Software Engineering, 41(2), 176-97. https://doi.org/10.1109/tse.2014.2361131 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
