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Carnio, B. N., Attiaoui, A., Assali, S., Moutanabbir, O., Elezzabi, A. Y., Sadwick, L. P., & Yang, T. (janvier 2022). A method based on complementary transmission and reflection measurements for extracting the optical properties of a thin film [Communication écrite]. Terahertz, RF, Millimeter, and Submillimeter-Wave Technology and Applications XV, San Francisco, California, United States. Lien externe
