Documents publiés en "2017"

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Jay, A., Raine, M., Richard, N., Mousseau, N., Goiffon, V., Hémeryck, A., & Magnan, P. (2017). Simulation of Single Particle Displacement Damage in Silicon-Part II: Generation and Long-Time Relaxation of Damage Structure. IEEE Transactions on Nuclear Science, 64(1), 141-148. Lien externe