Documents publiés en "2011"

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Hähnel, A., Reiche, M., Moutanabbir, O., Blumtritt, H., Geisler, H., Hoentschel, J., & Engelmann, H.-J. (2011). Nano‐beam electron diffraction evaluation of strain behaviour in nano‐scale patterned strained silicon‐on‐insulator. Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics, 8(4), 1319-1324. Lien externe

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Reiche, M., Moutanabbir, O., Hoentschel, J., Hähnel, A., Flachowsky, S., Gösele, U., & Horstmann, M. (2011). Strained Silicon Nanodevices. Dans Hanbücken, M., Müller, P., & Wehrspohn, R. B. (édit.), Mechanical Stress on the Nanoscale (p. 131-150). Lien externe