Documents publiés en "2011"
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Nourivand, A., Al-Khalili, A. J., & Savaria, Y. (2011). Analysis of resistive open defects in drowsy SRAM cells. Journal of Electronic Testing: Theory and Applications, 27(2), 203-213. Lien externe
Nourivand, A., Al-Khalili, A. J., & Savaria, Y. (2011). Analysis of resistive open defects in drowsy SRAM cells. Journal of Electronic Testing: Theory and Applications, 27(2), 203-213. Lien externe