Documents publiés en "2004"

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Duval, O., & Savaria, Y. (mai 2004). An on-chip delay measurements module for nanostructures characterization [Communication écrite]. IEEE International Symposium on Circuits and Systems (ISCAS 2004), Vancouver, BC, Canada. Lien externe

Duval, O., Lafrance, L. P., Savaria, Y., & Desjardins, P. (août 2004). An Integrated Test Platform for Nanostructure Electrical Characterization [Communication écrite]. International Conference on Mems, Nano and Smart Systems (ICMENS 2004), Banff, Canada. Lien externe