Documents publiés en "2003"

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Lu, M., Savaria, Y., Qiu, B., & Taillefer, J. (novembre 2003). IEEE 1149.1 based defect and fault tolerant scan chain for wafer scale integration [Communication écrite]. 18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2003), Boston, MA, United states. Lien externe