Documents publiés en "1999"
Monter d'un niveauNombre de documents: 2
Département de génie électrique
Boubezari, S., Cerny, E., Kamińska, B., & Nadeau-Dostie, B. (1999). Testability Analysis and Test-Point Insertion in Rtl Vhdl Specifications for Scan-Based Bist. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 18(9), 1327-1340. Lien externe
Département de génie informatique et génie logiciel
Boubezari, S., Cerny, E., Kamińska, B., & Nadeau-Dostie, B. (1999). Testability Analysis and Test-Point Insertion in Rtl Vhdl Specifications for Scan-Based Bist. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 18(9), 1327-1340. Lien externe