Documents publiés en "1997"
Monter d'un niveauDépartement de génie électrique
Abou Khalil, M., Schreurs, D., Nauwelaers, B., Van Rossum, M., Maciejko, R., & Wu, K. (1997). Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors. Journal of Applied Physics, 82(12), 6312-6318. Lien externe
Département de génie informatique et génie logiciel
Abou Khalil, M., Schreurs, D., Nauwelaers, B., Van Rossum, M., Maciejko, R., & Wu, K. (1997). Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors. Journal of Applied Physics, 82(12), 6312-6318. Lien externe
Département de génie physique
Abou Khalil, M., Schreurs, D., Nauwelaers, B., Van Rossum, M., Maciejko, R., & Wu, K. (1997). Effect of capture and escape phenomena in Monte Carlo technique on the simulation of the nonlinear characteristics in high electron mobility transistors. Journal of Applied Physics, 82(12), 6312-6318. Lien externe