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Abderrahman, A., Cerny, E., & Kaminska, B. (1996). Optimization-based multifrequency test generation for analog circuits. Journal of Electronic Testing: Theory and Applications (JETTA), 9(1-2), 59-73. Lien externe
Bois, G., & Cerny, E. (1996). Efficient generation of diagonal constraints for 2-D mask compaction. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 15(9), 1119-1126. Lien externe
