Documents publiés en "1995"

B

Blais, C., L'Espérance, G., Baril, E., & Forget, C. (août 1995). Estimation of errors resulting from stereological measurements of inclusions characterized by X-ray mapping in SEM [Communication écrite]. Microbeam analysis society 1995, Breckenridge, Colorado, USA. Non disponible

H

Hovington, P., L'Espérance, G., Baril, E., & Rigaud, M. (1995). Monitoring the performance of energy-dispersive spectrometer detectors at low-energy. Journal of scanning microscopy, 17(3), 136-138. Lien externe