Documents publiés en "1989"
Monter d'un niveauNombre de documents: 1
Lu, Z. H., Azelmad, A., Trudeau, Y., & Yelon, A. (1989). Damage profile of ion-implanted GaAs by x-ray photoelectron spectroscopy. Applied Physics Letters, 55(9), 846-848. Lien externe
Lu, Z. H., Azelmad, A., Trudeau, Y., & Yelon, A. (1989). Damage profile of ion-implanted GaAs by x-ray photoelectron spectroscopy. Applied Physics Letters, 55(9), 846-848. Lien externe