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Tamrin, M. O., Henwood, S., Dubois, J.-F., Brault, J.-J., Chidami, S., & Bassetto, S. (juin 2019). Using deep learning approaches to overcome limited dataset issues within semiconductor domain [Communication écrite]. 17th IEEE International New Circuits and Systems Conference (NEWCAS 2019), Munich, Germany (4 pages). Lien externe
