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Collaboration networkThis graph maps the connections between all the collaborators of {}'s publications listed on this page.
Each link represents a collaboration on the same publication. The thickness of the link represents the number of collaborations.
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Word cloudA word cloud is a visual representation of the most frequently used words in a text or a set of texts. The words appear in different sizes, with the size of each word being proportional to its frequency of occurrence in the text. The more frequently a word is used, the larger it appears in the word cloud. This technique allows for a quick visualization of the most important themes and concepts in a text.
In the context of this page, the word cloud was generated from the publications of the author {}. The words in this cloud come from the titles, abstracts, and keywords of the author's articles and research papers. By analyzing this word cloud, you can get an overview of the most recurring and significant topics and research areas in the author's work.
The word cloud is a useful tool for identifying trends and main themes in a corpus of texts, thus facilitating the understanding and analysis of content in a visual and intuitive way.
Gorse, N., Belanger, P., Chureau, A., Aboulhamid, E. M., & Savaria, Y. (2007). A High-Level Requirements Engineering Methodology for Electronic System-Level Design. Computers & Electrical Engineering, 33(4), 249-268. External link
Gorse, N., Aboulhamid, E. M., & Savaria, Y. (2004, July). Consistency validation of high-level requirements [Paper]. 4th International Workshop on System on Chip for Real Time Applications (IWSOC 2004), Banff, AB, Canada. External link
Gorse, N., Metzger, M., Lapalme, J., Aboulhamid, E. M., Savaria, Y., & Nicolescu, G. (2004, December). Enhancing ESys.Net with a semi-formal verification layer [Paper]. 16th International Conference on Microelectronics (ICM 2004), Tunisie. External link
Gorse, N., Bélanger, P., Aboulhamid, E. M., & Savaria, Y. (2004, December). Mixing linguistic and formal techniques for high-level requirements engineering [Paper]. 16th International Conference on Microelectronics (ICM 2004), Tunisie. External link
Nicolescu, B., Gorse, N., Savaria, Y., Aboulhamid, E. M., & Velazco, R. (2004, September). Validating a dynamic signature monitoring approach using the LTL model checking technique [Paper]. Workshop on Radiation Effects on Components and Systems (RADECS 2004), Madrid, Espagne. Unavailable
