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Abderrahman, A., Cerny, E., & Kaminska, B. (1999). Worst Case Tolerance Analysis and Clp-Based Multifrequency Test Generation for Analog Circuits. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 18(3), 332-345. Lien externe
Abderrahman, A., Cerny, E., & Kaminska, B. (avril 1997). CLP-based multifrequency test generation for analog circuits [Communication écrite]. 1997 15th VLSI Test Symposium, Monterey, CA, USA. Lien externe
Abderrahman, A., Cerny, E., & Kaminska, B. (1996). Optimization-based multifrequency test generation for analog circuits. Journal of Electronic Testing: Theory and Applications (JETTA), 9(1-2), 59-73. Lien externe
Boubezari, S., Cerny, E., Kaminska, B., & Nadeau-Dostie, B. (1999). Testability Analysis and Test-Point Insertion in Rtl Vhdl Specifications for Scan-Based Bist. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 18(9), 1327-1340. Lien externe
Bois, G., & Cerny, E. (1996). Efficient generation of diagonal constraints for 2-D mask compaction. IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 15(9), 1119-1126. Lien externe
