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Monte, G., Antaki, B., Patenaude, S., Savaria, Y., Thibeault, C., & Trouborst, P. (avril 2001). Tools for the characterization of bipolar CML testability [Communication écrite]. 19th IEEE VLSI Test Symposium (VTS 2001), Marina Del Rey, CA, USA. Lien externe
Antaki, B., Savaria, Y., Saman, A., Xiong, N., Borrione, D., & Ernst, R. (mars 1999). Design for testability method for CML digital circuits [Communication écrite]. Design, Automation and Test in Europe Conference and Exhibition (DATE 1999), Munich, Germany. Lien externe
Bélanger, N., Antaki, B., & Savaria, Y. (juillet 1997). An algorithm for fast array transfers [Communication écrite]. 11th Annual International Symposium on High Performance Computing Systems, Winnipeg, Man., Canada. Non disponible