Defect identification using TNAH: An exploration

Sophie Verpeaux, Joël Chamberland-Lauzon, Alexandre Montplaisir-Gonçalves, Annie Ross

Présentation (2010)

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Résumé

The main objective of this paper is to investigate the possibilities to identify defects on structures using the newly developed TNAH method (Transient Near-field Acoustical Holography, or Transient NAH). TNAH is a specific NAH formulation for transient cases. It uses a Laplace transform in the time domain instead of a Fourier transform: the Laplace transform handles delays more efficiently and eliminates time aliasing problems. The new formulation provides precise observation of transient acoustic fields and opens new possibilities for the technique. The method was applied to 50cmx30cmx6mm Plexiglas plates with macroscopic defects. The defects considered were a local added mass and a small hole. It is possible to observe differences in the sound fields radiated from the modified plate and the reference plate. The comparison of time pressure signals of points close to the defects and symmetric points shows amplitude differences and delays. Although it is not possible so far to precisely localize the defects on the plate, the possibility of improving the detection capacity to the microscopic level is discussed.

Renseignements supplémentaires:
Session: Acoustical holography, imaging and beam forming
ISBN:
9781617823961
Adresse URL de PolyPublie:
Nom de la conférence:
39th International Congress on Noise Control Engineering 2010 (INTER-NOISE 2010)
Lieu de la conférence:
Lisbon, Portugal
Date(s) de la conférence:
2010-06-13 - 2010-06-16
Maison d'édition:
Institute of Noise Control Engineering
OAI:
oai:publications.polymtl.ca:82965
ORCID
Date du dépôt:
29 sept. 2026 13:13
Dernière modification:
14 oct. 2026 14:48
Citer en APA 7:
Verpeaux, S., Chamberland-Lauzon, J., Montplaisir-Gonçalves, A., & Ross, A. (juin 2010). Defect identification using TNAH: An exploration [Présentation]. Dans 39th International Congress on Noise Control Engineering 2010 (INTER-NOISE 2010), Lisbon, Portugal.

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