Hall effect measurements to determine surface electronic properties of semiconductor epitaxial films

Rémo A. Masut

Article (2025)

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Journal Title :
Journal of Applied Physics ( vol. 138 , no. 4 )
Publisher:
American Institute of Physics
OAI:
oai:publications.polymtl.ca:66682
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Date Deposited:
23 Jul 2025 12:28
Last Modified:
03 Oct 2026 00:11
Cite in APA 7:
Masut, R. A. (2025). Hall effect measurements to determine surface electronic properties of semiconductor epitaxial films. Journal of Applied Physics, 138(4), 045301 (15 pages). https://doi.org/10.1063/5.0267523

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