B. Heimann, Stephan Reuter
, F. Deuerler and V. Buck
Article (2004)
Document published while its authors were not affiliated with Polytechnique Montréal
This item is not archived in PolyPublie
| PolyPublie URL: | https://publications.polymtl.ca/43970/ |
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| Journal Title: | Galvanotechnik (vol. 95, no. 4) |
| Date Deposited: | 18 Apr 2023 15:19 |
| Last Modified: | 25 Sep 2024 16:31 |
| Cite in APA 7: | Heimann, B., Reuter, S., Deuerler, F., & Buck, V. (2004). Qualitätssicherung durch Schichtdickenmessung von Diamant- und diamantartigen Schichten. Galvanotechnik, 95(4), 994-1001. |
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