T. S. Ramu and Michael R. Wertheimer
Article (1986)
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| Department: | Department of Engineering Physics |
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| PolyPublie URL: | https://publications.polymtl.ca/38214/ |
| Journal Title: | IEEE Transactions on Electrical Insulation (vol. EI-21, no. 4) |
| Publisher: | IEEE |
| DOI: | 10.1109/tei.1986.348958 |
| Official URL: | https://doi.org/10.1109/tei.1986.348958 |
| Date Deposited: | 18 Apr 2023 15:26 |
| Last Modified: | 08 Apr 2025 07:01 |
| Cite in APA 7: | Ramu, T. S., & Wertheimer, M. R. (1986). Dielectric Properties of Plasma-Polymerized Hexamethyldisiloxane Films: 2 Dielectric Breakdown. IEEE Transactions on Electrical Insulation, EI-21(4), 557-563. https://doi.org/10.1109/tei.1986.348958 |
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