Galvanostatic Rejuvenation of Electrochromic WO3 Thin Films : Ion Trapping and Detrapping Observed by Optical Measurements and by Time-of-Flight Secondary Ion Mass Spectrometry

Bill Baloukas, Miguel A. Arvizu, Rui-Tao Wen, Gunnar A. Niklasson, Claes G. Granqvist, Richard Vernhes, Jolanta-Ewa Sapieha et Ludvik Martinu

Article de revue (2017)

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Département:	Département de génie physique
URL de PolyPublie:	https://publications.polymtl.ca/37440/
Titre de la revue:	ACS Applied Materials & Interfaces (vol. 9, no 20)
Maison d'édition:	American Chemical Society (ACS)
DOI:	10.1021/acsami.7b01260
URL officielle:	https://doi.org/10.1021/acsami.7b01260
Date du dépôt:	18 avr. 2023 15:04
Dernière modification:	05 avr. 2024 11:31

Citer en APA 7:	Baloukas, B., Arvizu, M. A., Wen, R.-T., Niklasson, G. A., Granqvist, C. G., Vernhes, R., Sapieha, J.-E., & Martinu, L. (2017). Galvanostatic Rejuvenation of Electrochromic WO3 Thin Films : Ion Trapping and Detrapping Observed by Optical Measurements and by Time-of-Flight Secondary Ion Mass Spectrometry. ACS Applied Materials & Interfaces, 9(20), 16995-17001. https://doi.org/10.1021/acsami.7b01260

Citer en APA 7:

Baloukas, B., Arvizu, M. A., Wen, R.-T., Niklasson, G. A., Granqvist, C. G., Vernhes, R., Sapieha, J.-E., & Martinu, L. (2017). Galvanostatic Rejuvenation of Electrochromic WO3 Thin Films : Ion Trapping and Detrapping Observed by Optical Measurements and by Time-of-Flight Secondary Ion Mass Spectrometry. ACS Applied Materials & Interfaces, 9(20), 16995-17001. https://doi.org/10.1021/acsami.7b01260

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