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Low-level trace correlation on heterogeneous embedded systems

Thomas Bertauld and Michel R. Dagenais

Article (2017)

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Terms of Use: Creative Commons Attribution.
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Cite this document: Bertauld, T. & Dagenais, M. R. (2017). Low-level trace correlation on heterogeneous embedded systems. EURASIP Journal on Embedded Systems, 2017(1), p. 1-14. doi:10.1186/s13639-016-0067-1
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Tracing is a common method used to debug, analyze, and monitor various systems. Even though standard tools and tracing methodologies exist for standard and distributed environments, it is not the case for heterogeneous embedded systems. This paper proposes to fill this gap and discusses how efficient tracing can be achieved without having common system tools, such as the Linux Trace Toolkit (LTTng), at hand on every core. We propose a generic solution to trace embedded heterogeneous systems and overcome the challenges brought by their peculiar architectures (little available memory, bare-metal CPUs, or exotic components for instance). The solution described in this paper focuses on a generic way of correlating traces among different kinds of processors through traces synchronization, to analyze the global state of the system as a whole. The proposed solution was first tested on the Adapteva Parallella board. It was then improved and thoroughly validated on TI’s Keystone 2 System-on-Chip (SoC).

Uncontrolled Keywords

Heterogeneous embedded systems, Tracing, Traces synchronization, Traces correlation, Parallella, Keystone 2

Open Access document in PolyPublie
Subjects: 2700 Technologie de l'information > 2700 Technologie de l'information
2700 Technologie de l'information > 2715 Optimisation
Department: Département de génie informatique et génie logiciel
Research Center: Non applicable
Funders: CRSNG/NSERC, Ericsson, Prompt, EfficiOS
Date Deposited: 04 May 2018 16:30
Last Modified: 08 Apr 2021 10:43
PolyPublie URL: https://publications.polymtl.ca/3077/
Document issued by the official publisher
Journal Title: EURASIP Journal on Embedded Systems (vol. 2017, no. 1)
Publisher: Springer Open
Official URL: https://doi.org/10.1186/s13639-016-0067-1


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