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Reliability and cost evaluation of third-generation wireless access network topologies: a case study

Fabien Houeto, Samuel Pierre, Ronald Beaubrun and Yves Lemieux

Article (2002)

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Additional Information: Nom historique du département: Département de génie informatique
Department: Department of Computer Engineering and Software Engineering
PolyPublie URL: https://publications.polymtl.ca/26570/
Journal Title: IEEE Transactions on Reliability (vol. 51, no. 2)
Publisher: IEEE
DOI: 10.1109/tr.2002.1011530
Official URL: https://doi.org/10.1109/tr.2002.1011530
Date Deposited: 18 Apr 2023 15:20
Last Modified: 05 Apr 2024 11:13
Cite in APA 7: Houeto, F., Pierre, S., Beaubrun, R., & Lemieux, Y. (2002). Reliability and cost evaluation of third-generation wireless access network topologies: a case study. IEEE Transactions on Reliability, 51(2), 229-239. https://doi.org/10.1109/tr.2002.1011530

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