Maksim A. Skorobogatiy
, Steven A. Jacobs, Steven G. Johnson, Michel Meunier and Yoel Fink
Paper (2004)
An external link is available for this item
| Department: | Department of Engineering Physics |
|---|---|
| PolyPublie URL: | https://publications.polymtl.ca/24601/ |
| Conference Title: | Photonic Crystal Materials and Nanostructures |
| Conference Location: | Strasbourg, France |
| Conference Date(s): | 2004-04-27 - 2004-04-29 |
| Publisher: | SPIE - International Society for Optical Engineering |
| DOI: | 10.1117/12.545249 |
| Official URL: | https://doi.org/10.1117/12.545249 |
| Date Deposited: | 18 Apr 2023 15:19 |
| Last Modified: | 25 Sep 2024 16:04 |
| Cite in APA 7: | Skorobogatiy, M. A., Jacobs, S. A., Johnson, S. G., Meunier, M., & Fink, Y. (2004, April). Modeling the impact of manufacturing imperfections on photonic crystal device performance: design of perturbation-tolerant PGB components [Paper]. Photonic Crystal Materials and Nanostructures, Strasbourg, France. https://doi.org/10.1117/12.545249 |
|---|---|
Statistics
Dimensions
Repository Staff Only
|
View Item |
