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Ikama, A., Du, V., Belias, P., Muse, B. A., Khomh, F., & Hamdaqa, M. (octobre 2022). Revisiting the Impact of Anti-patterns on Fault-Proneness: A Differentiated Replication [Communication écrite]. 22nd IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM 2022), Limassol, Cyprus. Lien externe
